High-Speed Chip Testing with Fault Detection and Power Characterization

Our client, a leading semiconductor manufacturer was working on a wearable device project and faced critical challenges in ensuring robust chip functionality. Their goals were twofold: achieving comprehensive test coverage to catch any faults and minimizing the test time to less than 50 milli Seconds for a chip. Additionally, they sought to characterize the power rating of the chip accurately, striving for optimal energy efficiency.

we harnessed the power of the Verigy 93k ATE (Automatic Test Equipment) to rigorously evaluate the digital parameters of the chip.

Leveraging advanced ATPG (Automatic Test Pattern Generation) & BIST (Built-In Self-Test) techniques, we achieved comprehensive coverage, detecting any faults or failures within the target test time.

We monitored power consumption, thermal behavior, and overall stability. Verified the chip’s power endurance, ensuring it could last for five days on a full charge.